Journals Information
Universal Journal of Electrical and Electronic Engineering Vol. 7(6), pp. 315 - 319
DOI: 10.13189/ujeee.2020.070603
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A Survey on Different Attacks in LTE/LTE-A Networks
K. Venkata Pavan *, S. Shanthi
Department of Electronics and Communication Engineering, Saveetha School of Engineering, Chennai-602105, India
ABSTRACT
This paper is about security assaults in LTE/LTE-A Systems. The Long haul Development (LTE)/LTE-Progressed (LTE-An) arrange gives propelled administrations to billions of clients with its higher transfer speeds, better range effectiveness, and lower dormancy than heritage cell systems. Be that as it may, regardless of whether it experiences new security dangers because of its everything IP-based heterogeneous design. Accordingly, there is a basic need to play out a fast and precise system security estimation in LTE/LTE-A system. To accomplish LTE/LTE-A system security estimation, security-applicable information (in short security information) assortment and information examination for assault discovery are required as essentials. Be that as it may, the majority of the current work just spotlights on information assortment and examination for a specific sort of LTE/LTE-An assaults. Little work has been done to exhaustively perform information assortment and examination for identifying different assaults on LTE/LTE-A system. Not quite the same as past work, In this paper we focused on DOS, DDOS Man-in-the-Center (MitM) assaults, rebel base station assaults and the answers for such assaults were broken down to secure LTE and LTE-A systems
KEYWORDS
LTE, LTE-A, DOS, DDOS, Man in the Center Attacks
Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] K. Venkata Pavan , S. Shanthi , "A Survey on Different Attacks in LTE/LTE-A Networks," Universal Journal of Electrical and Electronic Engineering, Vol. 7, No. 6, pp. 315 - 319, 2020. DOI: 10.13189/ujeee.2020.070603.
(b). APA Format:
K. Venkata Pavan , S. Shanthi (2020). A Survey on Different Attacks in LTE/LTE-A Networks. Universal Journal of Electrical and Electronic Engineering, 7(6), 315 - 319. DOI: 10.13189/ujeee.2020.070603.