Journals Information
Computer Science and Information Technology Vol. 2(1), pp. 51 - 54
DOI: 10.13189/csit.2014.020106
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The Reliability of Circuits in the Basis Anticonjunction with Constant Faults of Gates
M. A. Alekhina *, O.Yu. Barsukova
Russia, Penza
ABSTRACT
We consider the realization of Boolean functions by asymptotically optimal reliable circuits with constant faults at the outputs of the gates in the basis {x|y} (where x|y п»„- anticonjunction i.п»„. 
). It is proved that almost all Boolean functions can be realized by asymptotically optimal reliable circuits that operate with unreliability asymptotically equal to 2ε0 +ε1 at ε0, ε1 → 0, where ε0 – probability of faults of type 0 at the output of basis gate, ε1 – probability of faults of type 1 at the output of basis gate.
KEYWORDS
Functional Gates Circuit, Unreliability of A Circuit, Faults of the Type 0 and 1 at the Outputs
Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] M. A. Alekhina , O.Yu. Barsukova , "The Reliability of Circuits in the Basis Anticonjunction with Constant Faults of Gates," Computer Science and Information Technology, Vol. 2, No. 1, pp. 51 - 54, 2014. DOI: 10.13189/csit.2014.020106.
(b). APA Format:
M. A. Alekhina , O.Yu. Barsukova (2014). The Reliability of Circuits in the Basis Anticonjunction with Constant Faults of Gates. Computer Science and Information Technology, 2(1), 51 - 54. DOI: 10.13189/csit.2014.020106.