Journals Information
Universal Journal of Electrical and Electronic Engineering Vol. 3(1), pp. 24 - 30
DOI: 10.13189/ujeee.2015.030105
Reprint (PDF) (3611Kb)
Outdoor-to-indoor Propagation Characteristics of 1900 MHz Signals in Macro-cellular Environments for GSM and UMTS Systems
Hisham Elgannas *, Ivica Kostanic
Department of Electrical and Computer Engineering, Florida Institute of Technology, United States
ABSTRACT
Building penetration loss at 1900 MHz bands in suburban environment is evaluated. The measurements are conducted in real Global System for Mobile Communications (GSM) and Universal Mobile Telecommunications System (UMTS) networks. Four buildings are studied aiming to provide first-order statistics of mobile signal coverage inside buildings. Results show that, on average, no significant signal band dependency has been confirmed. In general, UMTS-1900 MHz signals exhibit slight higher penetration loss values than GSM-1900 MHz signals. Analysis shows that the mean building penetration loss for all measured signals at the ground floor is about 16 dB. The standard deviation of building penetration loss was about 4.5 dB for wideband signals and 2.5 dB for narrowband signals. Results show also that, the average rate of change in building penetration loss with height is 0.95 dB per meter for wideband signals versus 0.65 dB per meter for narrowband signals.
KEYWORDS
GSM-1900MHz, UMTS-1900MHz, Outdoor-to-indoor Propagation, Building Penetration Loss, Floor Height Gain
Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] Hisham Elgannas , Ivica Kostanic , "Outdoor-to-indoor Propagation Characteristics of 1900 MHz Signals in Macro-cellular Environments for GSM and UMTS Systems," Universal Journal of Electrical and Electronic Engineering, Vol. 3, No. 1, pp. 24 - 30, 2015. DOI: 10.13189/ujeee.2015.030105.
(b). APA Format:
Hisham Elgannas , Ivica Kostanic (2015). Outdoor-to-indoor Propagation Characteristics of 1900 MHz Signals in Macro-cellular Environments for GSM and UMTS Systems. Universal Journal of Electrical and Electronic Engineering, 3(1), 24 - 30. DOI: 10.13189/ujeee.2015.030105.